Turkish Journal of Physics

Abstract: A thin film with the nominal composition of Bi₂Sr₂CaCu₂O_x(2212) was prepared on a MgO single crystal substrate by electron beam evaporation technique. The film, analyzed by x-ray diffraction, showed a preferential orientation with the c-axis prependicular to the substrate. The existence of at least two phases was seen from x-ray analysis. Electrical measurement was performed on the thin film of 2212 composition. The resistivity was confirmed to be smaller then 0.20x10^-4 W.cm by using the van der Pauw method at 300K and critical current density was in excess of 1.2x10⁴ A/cm² at 38K in zero field.