Turkish Journal of PhysicsPreparation of Thin Bi2Sr2CaCu2Ox (2212) Film and Electrical Measurements
Abstract: A thin film with the nominal composition of Bi2Sr2CaCu2Ox(2212) was prepared on a MgO single crystal substrate by electron beam evaporation technique. The film, analyzed by x-ray diffraction, showed a preferential orientation with the c-axis prependicular to the substrate. The existence of at least two phases was seen from x-ray analysis. Electrical measurement was performed on the thin film of 2212 composition. The resistivity was confirmed to be smaller then 0.20x10-4 W.cm by using the van der Pauw method at 300K and critical current density was in excess of 1.2x104 A/cm2 at 38K in zero field.
Turk. J. Phys., 20, (1996), 1012-1016.
Other articles published in the same issue: Turk. J. Phys.,vol.20,iss.9.