Turkish Journal of Physics

Electrical Characterization of GaTe and GaTe:Cu Semiconductor Compounds
Hüsnü Salih GÜDER
Mustafa Kemal Üniversitesi, Fen-Edebiyat Fakültesi,
Fizik Bölümü, 31040 Hatay-TURKEY
Bahattin ABAY, Hasan EFEOĞLU,
Cevdet COŞKUN, Şakir AYDOĞAN, Yahya Kemâl YOĞURTÇU
Atatürk Üniversitesi, Fen-Edebiyat Fakültesi, Fizik
Bölümü, 25240 Erzurum-TURKEY

Abstract: Electrical properties of GaTe and GaTe:Cu binary compound semiconductors were investigated by Hall effect and resistivity measurements in the 77-320 K temperature range. Donor and acceptor densities, compensation ratios, acceptor ionization energies, valence band effective mass of holes and effective density of states in valence band were determined for the undoped and Cu doped samples using the single donor-single acceptor analysis of the hole concentration. Temperature coefficient of the hole mobility was determined and compared with related theories.

Key Words: Electrical characterization; layered semiconductors; GaTe.

Turk. J. Phys., 25, (2001), 523-528.
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Other articles published in the same issue: Turk. J. Phys.,vol.25,iss.6.